X-ray Fresnel diffractometry for ultralow emittance diagnostics of next generation synchrotron light sources
نویسندگان
چکیده
منابع مشابه
Hard X-ray nanofocusing at low-emittance synchrotron radiation sources
X-ray scanning microscopy relies on intensive nanobeams generated by imaging a highly brilliant synchrotron radiation source onto the sample with a nanofocusing X-ray optic. Here, using a Gaussian model for the central cone of an undulator source, the nanobeam generated by refractive X-ray lenses is modeled in terms of size, flux and coherence. The beam properties are expressed in terms of the ...
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ژورنال
عنوان ژورنال: Physical Review Special Topics - Accelerators and Beams
سال: 2015
ISSN: 1098-4402
DOI: 10.1103/physrevstab.18.042802